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TM3000 Tabletop Microscope
The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
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Research AFM-XE-100
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
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IR-OBIRCH Analysis System
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
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PHI VersaProbe XPS Microprobe
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
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FB2200 Focused Ion Beam System
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
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SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
X-ray Fluorescence
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| MESA 6000 |  |
All of the compact bench top models utilize a new approach to EDXRF, Monochromatic Excitation-EDXRF or ME-EDXRF. Closely coupled monochromatic excitation combined with a high resolution detector provide excellent signal to background ratios to achieve low detection limits even in various matrices. |
| Mesa-500W XRF |  |
MESA-500W handles solid, liquid and powder samples with “One touch” fully automatic operation that requires no specialized operator knowledge. |
| XGT-1000WR XRF |  |
XGT-1000WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br). |
| XGT-5000 X-ray Analytical Microscope |
 |
XGT-5000WR are specially designed for WEEE/RoHS, ELV and Chinese RoHS for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) and equipped X-ray Microscope Functions |
| XGT-7000 Microanalytical Microscope |
 |
The XGT-7000 represents a completely new generation of XRF microscope, and leads the way to a new era of science. |
| SLFA-20 |  |
SLFA-20 X-ray Fluorescence Sulphur-in-Oil Analyzer The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG. Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field. |
| SLFA-2100/2800 |  |
SLFA-2100/2800 X-ray Fluorescence Sulfur-in-Oil Analyzers The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG. Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field. |