The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
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The U-5100 incorporates every aspect of the technological features of Hitachi's reliability-proven spectrophotometers while achieving our ultimate goal to create a spectrophotometer that is ECO-FRIENDLY & CLEAN and provides SUPERIOR PERFORMANCE.
Spectrophotometer simpler to use an higher in dependability thanks to mounting of a large-size color LCD.
Covers a wide variety of analysis needs from liquid samples to solid samples. Line-up of two types that can be selected in accordance with the measuring object and application. For use in a wide range of fields that focus on water quality, the environment, biotechnology, pharmaceuticals, materials, etc.
U-4100 is the highest-end model achieving high accuracy of which "Famous Hitachi Photometer"is proud. It is the best choice for the user who requires high quality data in the measurement of an actual solid sample, for example in the development of semiconductors, optical materials and new materials.