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TM3000 Tabletop Microscope
The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
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Research AFM-XE-100
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
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IR-OBIRCH Analysis System
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
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PHI VersaProbe XPS Microprobe
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
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FB2200 Focused Ion Beam System
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
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SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
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Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
Distillation
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| OptiDist - Herzog |  |
Benchmark in Distillation Test Methods - ASTM D1078, ASTM D850, ASTM D86, IP 123, IP 195, ISO 3405 |
| HDV 632 - Herzog |  |
Vacuum Distillation Test Methods - ASTM D1160 |
| HDA 620 - Herzog |  |
Distillation Apparatus Test Methods - ASTM D1078, ASTM D850, ASTM D86, IP 123, IP 195, ISO 3405 |
| PMD110 - ISL |  |
Process Micro-Distillation Test Methods - ASTM D7345 |