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TM3000 Tabletop Microscope
The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
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Research AFM-XE-100
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
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IR-OBIRCH Analysis System
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
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PHI VersaProbe XPS Microprobe
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
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FB2200 Focused Ion Beam System
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
Product Categories
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SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
Particle Size Analysis
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| LA-950V2 |  |
Cutting Edge Optical Design: HORIBA's revolutionary optical design provides the widest dynamic range (0.01 - 3000 µm), highest signal-to-noise, fastest measurement time, and best nanoparticle performance of any laser diffraction instrument. The LA-950 is the only instrument capable of measuring 30 nanometers and 3 millimeters in the same instant for the same measurement. Only the world's most advanced optical design makes this possible. |
| LA-300 |  |
Range: 0.1 - 600µm Matching the widest range of applications with a performance equivalent to most competitors' full range systems. Compact Size: The compact size and low weight make this a convenient analyzer for today´s crowded laboratories. It also makes it possible to transport easily to different locations within a facility or ship to remote locations for on-site testing where it is not practical to purchase an analyzer. Fast Analysis: The highly-refined optical design and algorithm provides measurement results in 20 seconds, with class-leading accuracy and precision. |
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| SZ-100 |  |
The SZ-100 nanopartica series instruments are flexible analytical tools for characterizing the physical properties of small particles. Depending on the configuration and application the system can be used as a particle size analyzer, or also used to measure zeta potential, molecular weight, (MW) and second virial coefficient (A2). |