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TM3000 Tabletop Microscope
The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
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Research AFM-XE-100
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
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IR-OBIRCH Analysis System
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
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PHI VersaProbe XPS Microprobe
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
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FB2200 Focused Ion Beam System
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
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SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
Photon Emission Microscope
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| Phemos-1000 |  |
The PHEMOS-1000 is a standard model high-resolution emission microscope that includes an IR confocal laser scan microscope. |
| Phemos 200 | |
The Phemos-200 is an emission microscope with basic mesasurement performance. It is equipped with a 1024 x 1024 pixel high resolution, cooled CCD camera as standard. |
| THEMOS-1000 |  |
The THEMOS-1000 thermal emission analysis tool is a system for analyzing semiconductor failures through the detection and localization of the thermal signal generated within semiconductor devices. |
| THEMOS-Mini |  |
THEMOS mini is thermal emission microscope with a high-sensitivity InSb camera that detects internal heat emissions from a semiconductor device. By displaying the detected thermal image superimposed onto the pattern image, |
| Triphemos |  |
In response to the increased speed of CPU’s and the requirements for reduced power consumption in mobile devices, advanced ICs have undergone a lowering of voltage, conversion to flip chips, multi-layering and further size reductions. |
| uAMOS-200 |  |
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices. The S/N ratio can be greatly improved by using a lock-in unit to detect OBIRCH signal at specific frequency. Furthermore, by using the high current probe head, devices running at high current and high voltage can be analyzed. |