The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| SKZ-1 | ![]() |
Standard Model. |
| SKZ-2 | ![]() |
Standard and easy-to -observe Model with fluorescent ring-type illuminator which eliminates shadows. |
| SKZ-3 | ![]() |
Wide Workspace Model with large plane and long pole stand combined with ring-type fluorescent illuminator and mechanical stage,specially for electronic components assembly. |
| SKZ-4 | ![]() |
Ideal Model for extra-large size object,unmovable workpiece or wide-ranging observation. |
| SKZ-5 | ![]() |
Wide-randing Observational Model with built-in Incident & Transmitted Illuminators. |
| SKZ-6 | ![]() |
Specially Designed Model for flexible application such as add-on's for machinery. |
| SKZ-7 | ![]() |
High Work Efficiency Model for large board inspection with 300mm Skiding Table. |
| SKZ-60 | ![]() |
Eye piece 60°, inclined type , Long W.D、Combination of stand unit have check such as add-on's for machinery. |
| SKZ-90 | ![]() |
Long W.D. zoom head Model. |
| SKZ-TR-1 | ![]() |
A Trinocular Stereo Zoom micro-scope with a well-balanced large base a vailable for photography and TV Monitor Unit. |
|
|
![]() |
A Trinocular Stereo Zoom Microscope which combines a well-balanced arm type stand with a transmitted illuminating stage and equips with standard 35mm photo equipment. |
|
|
![]() |
A Trinocular Stereo Zoom Microscope which combines a well-balanced arm type stand with a TV Monitor Unit. |
|
|
![]() |
A Trinocular Stereo Zoom Microscope with a well-balanced large base available for photography and TV Monitor Units. Can get the incident and transmitted illumination suitable for workpiece by means of halogen lamp,through a light controller. |
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| SM-240 | ![]() |
Please click on the provided link to see more information. |
| SM-240-L | ![]() |
Please click on the provided link to see more information. |
| SDM-210 | ![]() |
Please click on the provided link to see more information. |
| SDM-210L | ![]() |
Please click on the provided link to see more information. |
| SDM-TR67N | ![]() |
Please click on the provided link to see more information. |
| SM-TR-67N | ![]() |
Please click on the provided link to see more information. |
| SMC | ![]() |
Please click on the provided link to see more information. |
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| SB-BI-1C | ![]() |
Monocular(SB-MO)&Trinocular(SB-TR)(switching type) available. Photography/TV Camera can be mounted on Trinocular type. |
| SPH | ![]() |
This microscope is inverted type makes it possible to observe specimens in natural form. It is suitable to observe living tissues such as parasites and bacteria or check cultivation process of thes specimens in a petri dish. It easy to observe specimens especially by phase-contrast. |