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SIGMATECH, INC.

B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines

Phone    - (632)358-5889 (Service)
                - (632)576-8913 (Sales)
                - (632)576-1599 (Admin/Accounting)
Fax          - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
                - 0917 847-5730 (Globe)
Email      - sales@sigmatech-inc.com
                - service@sigmatech-inc.com

Electron Microscope

(S)TEM (Transmission Electron Microscope)
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TM3000 - Smaller, compact and lightweight design,
- Higher resolution, higher magnification
- Easier to operate
- One button auto start,
- Larger stage, larger samples
- Variable accelerating voltage, (enhanced sample surface observation)
- Beam current control,
- Plugs into standard outlet, no other facilities required - User friendly GUI on Windows® 7


(S)TEM (Transmission Electron Microscope)
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SU1510 Compact & High-performance
- 20 % Reduction in Footprint Compared to the Current Model VP Mode Standard
- SE 3.0 nm Resolution at 30 kV, BSE 4.0 nm (6 Pa) Guaranteed
- Accommodates Samples up to 153 mm (diameter) and 60 mm (height)
Saving floor space and electric power consumption due to TMP evacuation system.
S-3400N A yet more user-friendly SEM through newly developed electron optics and Automatic functions.
- Revolutionary automatic axis-alignment functions (Auto Beam Setting, Auto Axial Alignment, etc.)
- Even better resolution of 10nm at 3kV
- Saving floor space and electric power consumption due to TMP evacuation system.
S-3700N The Analytical SEM for Studying Large, Heavy & Tall Samples.
- Large sample up to 300mm in diameter
- Observable area up to 203mm in diameter
- Observation and EDS analysis on a sample up to 110mm tall
- Versatile port layout for various analytical applications


(S)TEM (Transmission Electron Microscope)
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SU8000 SU8000 family has excellent features in common, like ultra high resolution imaging technology (1.3nm/1.0kV), wide ranges of signal detecting system, and user-friendly operetionality. SU8000 family offers variety of stages, chambers and signal detecting systems to meet the wide variety of customer-specific needs of ultra high resolution microscopy.


(S)TEM (Transmission Electron Microscope)
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HF-3300 Combination of high reputation Hitachi cold field emission electron source and 300 kV accelerating voltage realizes both ultrahigh resolution imaging and high sensitivity analysis. Double bi-prism holography, spatially resolved EELS and high precision parallel nanobeam electron beam diffraction open a new avenue for efficient and high precision material analysis.
H-9500 High-throughput high-resolution electron microscopy.
Advanced digital user-friendly atomic resolution microscope, Integrated computer control with digital cameras allows various image processing functions, Hitachi's field proven high voltage technology allows for a quick automated startup of the entire system, Stable 5-Axis Hiper stage features automatic navigation and sample position trace capabilities
HD-2700 The dedicated scanning transmission microscope (STEM) HD-2700, equipped with spherical aberration corrector co-developed by CEOS GmbH (Germany, managing director: Dr. Max Haider), enables dramatically expanded STEM performance suitable for advanced nano-technology research.  
HT-7700 The HT7700 was designed with groundbreaking features, chief among these are a superior level of operability and an extensive range of useful digital imaging functions. These features ensure usability across the broadest possible range of applications fields, from the main application area of biomedicine to nanotechnology and soft carbon-based materials.


(S)TEM (Transmission Electron Microscope)
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FB2200 The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
NB5000 Legendary Hitachi reliability and performance in an integrated system (Ultra-high performance FIB and high resolution FE-SEM) enabling high-throughput specimen preparation, high resolution imaging and analysis and precision nanofabrication. New low-damage fabrication techniques have been developed for materials sensitive to electron irradiation. Innovations in sample loading, sample navigation, and Micro-sampling increase analysis efficiency


(S)TEM (Transmission Electron Microscope)
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IM4000 Hybrid Instrument With Cross-section milling and Flatmilling. Hybrid model: Two milling configurations available - Cross-section milling: smooth polishing of coss-section specimens for high resolutions imaging of subsurface structures. Flatmilling - uniform polishing of surfaces as large as 5 mm with variable angle milling to selectively enhance specimen surface features. .