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TM3000 Tabletop Microscope
The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
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Research AFM-XE-100
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
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IR-OBIRCH Analysis System
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
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PHI VersaProbe XPS Microprobe
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
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FB2200 Focused Ion Beam System
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
Product Categories
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- Polarimeter
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SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
Carbon, Nitrogen, Sulfur, Oxygen, Hydrogen, Halides
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| EMIA-V2 |  |
The EMIA-V2 series measures carbon and sulfur extracted during combustion in a programmable High Frequency furnace without conversion. Combustion control is achieved through the use of the high-frequency induction furnace method. |
| EMIA-8100 |  |
EMIA-8100 series equipped with electrical resistance furnace measures carbon and sulfur contained in such inorganic substances as ceramics and cement, such fuels as coal and heavy oil, and such high-purity metals and electronics materials as pure iron and nonferrous metals. |
| EMGA-930 |  |
EMGA-930 O/N/H analyzer: It's a "New flagship model” for O/N/H analyzers and user friendly product. |
| EMGA-920 |  |
EMGA-920 O/N analyzer: It's a "New flagship model” for O/N analyzers and user friendly product. |
| EMGA-921 |  |
This is a hydrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology's R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user's requests. The hydrogen is measured as H2 by a thermal conductivity detector. |