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TM3000 Tabletop Microscope
The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
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Research AFM-XE-100
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
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IR-OBIRCH Analysis System
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
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PHI VersaProbe XPS Microprobe
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
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FB2200 Focused Ion Beam System
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
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SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
Elemental Analysis
| product name |
image (click to enlarge) |
description |
|---|---|---|
| MultiTek-Antek |  |
Nitrogen, Sulfur & Halides Analyzer Test Methods - ASTM D4629, ASTM D5176, ASTM D5453, ASTM D5762, ASTM D6667, ASTM D7183, ASTM D7359, DIN 38409, EN ISO 20846, ENV 12260, UOP 936, UOP 971, EN 15486 Anteks MultiTek is the only instrument on the market that combines testing for sulfur, nitrogen, and halides all in one. Compact, powerful, automated, and multi-configurable,its the perfect solution to todays increasing demand worldwide for fast, accurate detection and analysis of unwanted chemicals, pollutants, contaminants, and corrosive elements. |