The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
SIGMATECH, INC.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion
Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting)
Fax - (632) 807-8392
Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe)
Email - sales@sigmatech-inc.com
- service@sigmatech-inc.com
| product name |
image (click to enlarge) |
description |
|---|---|---|
| Page Top | ||
| FA Series | ![]() |
Sturdy and compact design, Fully automatic calibration with external weight, One touch operation, Over load alarm RS-232C output interface, Level indicator and adjustable feet |
| JA Series | ![]() |
Large display, Automatic Calibration with external weight, Sturdy and compact design, RS-232C output interface, One Touch operation |
| JH Series | ![]() |
Large display, Automatic Calibration with external weight, Sturdy and compact design, RS-232C output interface, One Touch operation |
| YP-N Series | ![]() |
YP-N Series Compact Electronic Balance - Rugged and compact design, Total easy of operation, High precision, Over load alarm, Fully Automatic, external calibration |