The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting) Fax - (632) 807-8392 Hotlines - 0928 503-3281 (Smart)
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|TQACO2-Antek||Total Quality Assurance CO2 Analyzer
R6000N - Nitrogen by CNLD,R6000S - Sulfur by UVF,R1020 Aromatics,R1140 Total Hydrocarbons,Oxygen Analyzer,Moisture Content
The Antek TQACO2 analyzer by PAC is the only turnkey system for total quality assurance of CO2. Its a complete analyzer package with a single operating data system. With the TQACO2, gas suppliers and bulk CO2 users can generate their own load report to show compliance with specifications.