The TM3000 is Hitachi High Technologies latest Tabletop Microscope. New features include variable accelerating voltage, higher beam current, larger stage and chamber, and smaller footprint.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology.
The IR-OBIRCH Analysis System "μAMOS" is a semiconductor failure analyzer which uses IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) method for localization of leakage current path and the abnormal resistance part of contacts (via contact) in LSI devices.
The PHI 5000 VersaProbe is a multi-technique surface analysis instrument based on PHI's highly successful scanning x-ray microprobe technology.
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials.
B136 L1 C. Arellano St.
Katarungan Vill., (Daang Hari), Poblacion Muntinlupa City 1776, Philippines
Phone - (632)358-5889 (Service)
- (632)576-8913 (Sales)
- (632)576-1599 (Admin/Accounting) Fax - (632) 807-8392 Hotlines - 0928 503-3281 (Smart)
- 0917 847-5730 (Globe) Email - firstname.lastname@example.org - email@example.com
Sigmatech is a dynamic and fast growing company, specializing in sales and service of advanced technology laboratory equipment used in broad applications essential to QA/QC,R&D, Failure analysis, environmental and chemical analysis and process control.
We cater to a wide range of industries belonging to semiconductor, electronics, pharmaceutical, mining, food, petroleum, forensics, agriculture, automotive, biotechnology and nanotechnology research.
Founded in December 2000, with already over a decade of excellent service track record, our company continuously strives to improve our business with you in mind. Our dedication to provide the best in equipment with personal and efficient service sets Sigmatech apart from the competition.