An economic extension of the XE-100, the XE-70 is Park Systems's new affordable solution of Atomic Force Microscope (AFM). The result of a compact mechanical designing, the XE-70 continues the innovative technology of XE-AFM which sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as rest of XE-Series AFM.

With the arrival of the XE-100, our first product in the XE-Series product line, non-contact AFM has become the most feasible and practical way to scan your small samples with ultimate AFM resolution and reliability. With a trend-setting design engineered for product quality, user convenience, and customer support, the XE-100 is the ultimate AFM solution for the non-contact nanoscale metrology of small samples.

Non-contact mode is critical for the ultimate resolution and measurement accuracy of AFM in both ambient and liquid conditions. The XE-120 is the advanced AFM that combines the critical AFM innovations of the XE-100 with state-of-the-art functionality and features required by the life science community.

With the arrival of the XE-150, Park Systems's large sample AFM, non-contact AFM imaging has become the most feasible and practical way to scan your large samples with the ultimate AFM resolution and reliability. The XY motorized sample stage is optimized.