Atomic Force Microscopy (AFM) is emerging as an essential tool in the Hard Disk Drive industry. Park Systems, the original pioneer of AFM technology, has changed the concept of AFM by introducing XE-HDD, the industrial XE-system designed and tailored specifically for the needs of the Hard Disk Drive industry customers. XE-HDD was designed for the sole purpose of Hard Disk media processing and analysis, and it excels in obtaining superior images of Hard Disk Drive

Atomic Force Microscopy (AFM) is emerging as an essential tool for Pole-Tip-Recession (PTR) analysis within the Hard Disk Drive industry. Park Systems, the original pioneer of AFM technology, has changed the concept of AFM by introducing XE-PTR, the laboratorial/industrial XE-system designed and tailored specifically for precise and accurate PTR analysis.

Atomic Force Microscopy (AFM) is emerging as an essential tool in the semiconductor industry to characterize the results of processing such as the overall dishing or wash-out of the feed-through fields by Chemical Mechanical Polishing (CMP).

Park Systems, the original pioneer of AFM technology, has changed the concept of AFM by introducing the completely automated XE-LCD system for the inline production of flat panel displays. Our mission is to provide our industrial customers with advanced AFM products and solutions that extend the critical innovations of the XE-Series to the industrial metrology of flat panel displays.