(S)TEM/SEM specimen can be prepared with rapidity and accuracy.
 

• High milling rate with accelerating voltage up to 40kV
• In-situ microsample extraction from specific site with Hitachi's patented "Micro-sampling" (optional accessory)
• Compatible specimen holder available for (S)TEM(HD-2700, HD-2300A, H-9500) and SEM(S-5500). (A common stage is to be selected.)