The dedicated scanning transmission microscope (STEM) HD-2700, equipped with spherical aberration corrector co-developed by CEOS GmbH (Germany, managing director: Dr. Max Haider), enables dramatically expanded STEM performance suitable for advanced nano-technology research. Due to the correction of spherical aberration which has limited the performance of electron microscope, approximately 1.5 times higher resolution and 10 times higher probe current than the standard model are achieved simultaneously.

The HD-2300A is the third-generation 200kV dedicated scanning transmission microscope (STEM), which allows TEM level precise characterization combined with user-friendly features.

Shottky or cold FE is selected as an electron gun. The automated alignment functions simplify beam alignment, focusing and astigmatism correction. Highly-sensitive energy-dispersive X-ray analysis and real time elemental mapping by the EELS (electron energy loss spectroscopy) system (ELV series) are available as optional attachments. The other option, live diffraction camera, provides simultaneous viewing of the image and nano diffraction pattern.

The H-7650 is a high performance digital imaging TEM featuring a fully integrated high sensitivity digital camera mounted below the film camera chamber. This allows direct imaging at beam dose rates that would be insufficient to excite a traditional fluorescent screen imaging system, ensuring that there is the minimum of beam damage to sensitive samples. The H-7650 features single computer operation and a single display monitor. A comprehensive image processing and image data management system is also provided.

High-throughput high-resolution electron microscopy.

• Advanced digital user-friendly atomic resolution microscope
• Integrated computer control with digital cameras allows various image processing functions
• Hitachi's field proven high voltage technology allows for a quick automated startup of the entire system
• Stable 5-Axis Hiper stage features automatic navigation and sample position trace capabilities